Buchanan, William J (1997) Microelectronic systems: design, modelling and test. Arnold. ISBN 0-340-67771-6
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This text provides a comprehensive overview of the design, modellng and testing of microelectronic systems. It begins with a brief introduction to the history and development of microelectronics before discussing Bi-Polar and MOS Design (including CMOS and NMOS). After looking at memory systems and field programmable gate arrays it then goes on to explore all aspects of modelling, including VHDL, PSPICE and fault modelling. The third section looks at practical testing of systems, including a discussion of designing for testability and memory tests. This book finishes with a number of appendices that provide vital reference material for MOS characteristics, IC fabrication, design rules, VHDL and PSPICE references, including an excellent PSPICE tutorial.
This comprehensive coverage, from conception, through modelling to testing, of these key systems provides a fully up-to-date account that will prove invaluable for all those with an interest in microelectronics. --This text refers to an alternate Paperback edition.
|Uncontrolled Keywords:||Microelectronic systems; Bi-Polar; MOS design; memory systems; gate arrays; VHDL; PSPICE; fault modelling; ;|
|University Divisions/Research Centres:||Faculty of Engineering, Computing and Creative Industries > School of Computing|
|Dewey Decimal Subjects:||600 Technology > 620 Engineering > 621 Electronic & mechanical engineering > 621.3 Electrical & electronic engineering > 621.38 Electronics & Communications engineering|
|Depositing User:||Professor Bill Buchanan|
|Date Deposited:||22 Dec 2010 15:10|
|Last Modified:||12 Jan 2011 04:56|
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